Introduction
As you probably knows, FullProf has been mainly developed for Rietveld analysis (structure profile refinement) of neutron (nuclear and magnetic scattering) or X-ray powder diffraction data collected at constant or variable step in scattering angle 2θ. The program can be also used as a Profile Matching (or pattern decomposition) tool, without the knowledge of the structure. Single Crystal refinements can also be performed alone or in combination with powder data. Time-of-flight (TOF) neutron data analysis is also available. Energy dispersive X-ray data cal also be treated but only in profile matching mode.
The program EdPCR is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY of being free of internal errors. In no event will the authors be liable to you for damages, including any general, special, incidental or consequential damages arising out of the use or inability to use the program (including but not limited to loss of data or data being rendered inaccurate or losses sustained by you or third parties or a failure of the program to operate with any other programs). The authors are not responsible for erroneous results obtained with EdPCR. This manual cannot substitute the lack of knowledge of users on crystallography, magnetism, diffraction physics, and data analysis. The user must check his (her) data before claiming a malfunction of the program.
The authors acknowledges all suggestions and notification of possible bugs found in the program or in the manual.